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Metallography


  1. Sample preperation
  2. Optical Microscopy and Image Analizing
  3. Scanning Electrone Microscope (SEM)





  1. Sample Preparation
    • Precision wet abrasive cut-off machine ATM Brillant 221 (ATM 2002)
      The Brillant 221 is an adjustable precession wet cutting machine for exact sampling of small specimen with different geometries. The cutting discs (maxø 150mm; diamond, CBN, Al2O3, SiC) can be changed easily and the automated process flow can be defined by a simple user interface.

      Precision wet abrasive cut-off machine ATM Brillant 221 (ATM 2002)
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    • Opal 450 Embedding Machine (ATM 2002)
      The Opal 450 is a completely hydraulic water cooled embedding machine with water safe functioning and bayonet catch. By a LCD interface the needed parameters (time, temperature…) can be adjusted. The following process flow is completely automatically. By the solid construction the whole process is quite silent. The embedding procedure is finished after about 20 min. with a maximum embedding height of 30 mm. The comprehensive selection of mould assamblies from Ø 25, 40 and 50 mm enables optimum mounting of samples in the following metallographical preparations steps.


      Opal 450 Embedding Machine (ATM 2002)
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    • Semi automated embedding machine Labopress-1 (Struers 1997)
      The semiautomated embedding machine Labopress-1 enables the production of several specimens in 30 mm and 50 mm diameter. The single working steps need to be done and controlled manually. Preset temperatures are 150°C and 180°C.

      Semi automated embedding machine Labopress-1 (Struers 1997)
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    • Semi automated floor based plane grinding machine Abraplan/Abrapol (Struers 1989)
      The Abraplan and Abrpol enable the same grinding and polishing preparation steps as the Saphir 350/360/520 with the possibility of increasing forces to get a higher efficiency.

      Semi automated floor based plane grinding machine Abraplan/Abrapol (Struers 1989)
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    • Grinding and polishing Machine Saphir 350/360/520 (ATM 2002)
      The Saphir 350/360 ( 1x one-spindle, 1x one-spindle  with automated Rubin 520 head and 1x two-spindle with automated Rubin 520 head) grinding and polishing machine for max. 300 mm discs. The strong and rpm controlled drive allows grinding operations of 1200, 600, 320, 180 mesh size and polishing steps with 9 µm, 6 µm, 3 µm, 1 µm and OPS. The variable water supply can be adjusted manually. The addition of lubricants and water operates automatically whereas polishing suspensions must be added by hand.

      Grinding and polishing Machine Saphir 350/360/520 Grinding and polishing Machine Saphir 350/360/520
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    • Ultrasonic cleaning unit RK10 (Bandelin 2016)
      Ultrasonic cleaning devices are used for high purity demands in metallographic investigation or preparation steps. Specimens can be cleaned by timer modes up to 15 minutes.

      Ultrasonic cleaning unit RK10 (Bandelin 2016)
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  2. Optical Microscopy and Image Analizing
  3. Clemex Vision is a powerful image analysis solution for automated optical microscopy. It has a number of built-in imaging functions with whom image analysis routines can be assembled in a matter of minutes. One of the main feature is the “Mosaic”. With the Build Mosaic feature, Clemex Vision automatically stitches multiple fields to form a large image. As Hardware a Nikon MM 40 and a Polyvar Pol optical microscope with magnification possibilities of 15, 25, 50, 100, 200, 500 and 1000  and the use of several filters as IC,DF,BF and Pol are possible.

    Optical Microscope Nikon MM 40 with Image Analysis CLEMEX Vision 7; automated stage; 1,3 mpxl difital camera Sony DFW-X700

    Optical Microscope Nikon MM 40 with Image Analysis CLEMEX Vision 7; automated stage; 1,3 mpxl difital camera Sony DFW-X700

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    Optical Mikroskope Polyvar Pol with Image Analysis Clemex Vision 4.0; digital camera Clemex 3 Mpixel

    Optical Microscope Polyvar Pol with Image Analysis Clemex Vision 4.0; digital camera Clemex 3 Mpixel

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  4. Scanning Electrone Microscope (SEM)
    • Quanta 200 Mk2 (FEI 2007)
      The SEM produces high resolution images of conductive samples by a focused beam of electrons. The electrons interact with the sample and by various detectors topographical and chemical analysis can be done. Specimens are observed in high and low vacuum. The Quanta 200 Mk2 has a high performance thermal emission SEM column (W) and is assembled with a SED, LFD and a SS-BSED detector. For managing the system the program INCA Energy 200 (Oxford 2005) is used. Chemical investigations can be done manual or automated. (Additional Information...)


      Quanta 200 Mk2 (FEI 2007)
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